Lifetime measurements in an electrostatic ion beam trap using image charge monitoring

Igor Rahinov; Yoni Toker; Oded Heber; Daniel Strasser; Michael Rappaport; Dirk Schwalm; Daniel Zajfman

doi:10.1063/1.3694997

Lifetime measurements in an electrostatic ion beam trap using image charge monitoring

Igor Rahinov, Yoni Toker, Oded Heber, Daniel Strasser, Michael Rappaport, Dirk Schwalm, Daniel Zajfman

Research output: Contribution to journal › Review article › peer-review

16 Citations (Scopus)

Abstract

A technique for mass-selective lifetime measurements of keV ions in a linear electrostatic ion beam trap is presented. The technique is based on bunching the ions using a weak RF potential and non-destructive ion detection by a pick-up electrode. This method has no mass-limitation, possesses the advantage of inherent mass-selectivity, and offers a possibility of measuring simultaneously the lifetimes of different ion species with no need for prior mass-selection.

Original language	English
Article number	033302
Journal	Review of Scientific Instruments
Volume	83
Issue number	3
DOIs	https://doi.org/10.1063/1.3694997
Publication status	Published Online - 21 Mar 2012

All Science Journal Classification (ASJC) codes

Instrumentation

Access to Document

10.1063/1.3694997

Cite this

@article{effc4b013c36457dbb1ae71df648caf6,

title = "Lifetime measurements in an electrostatic ion beam trap using image charge monitoring",

abstract = "A technique for mass-selective lifetime measurements of keV ions in a linear electrostatic ion beam trap is presented. The technique is based on bunching the ions using a weak RF potential and non-destructive ion detection by a pick-up electrode. This method has no mass-limitation, possesses the advantage of inherent mass-selectivity, and offers a possibility of measuring simultaneously the lifetimes of different ion species with no need for prior mass-selection. ",

author = "Igor Rahinov and Yoni Toker and Oded Heber and Daniel Strasser and Michael Rappaport and Dirk Schwalm and Daniel Zajfman",

year = "2012",

month = mar,

day = "21",

doi = "10.1063/1.3694997",

language = "English",

volume = "83",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics",

number = "3",

}

TY - JOUR

T1 - Lifetime measurements in an electrostatic ion beam trap using image charge monitoring

AU - Rahinov, Igor

AU - Toker, Yoni

AU - Heber, Oded

AU - Strasser, Daniel

AU - Rappaport, Michael

AU - Schwalm, Dirk

AU - Zajfman, Daniel

PY - 2012/3/21

Y1 - 2012/3/21

N2 - A technique for mass-selective lifetime measurements of keV ions in a linear electrostatic ion beam trap is presented. The technique is based on bunching the ions using a weak RF potential and non-destructive ion detection by a pick-up electrode. This method has no mass-limitation, possesses the advantage of inherent mass-selectivity, and offers a possibility of measuring simultaneously the lifetimes of different ion species with no need for prior mass-selection.

AB - A technique for mass-selective lifetime measurements of keV ions in a linear electrostatic ion beam trap is presented. The technique is based on bunching the ions using a weak RF potential and non-destructive ion detection by a pick-up electrode. This method has no mass-limitation, possesses the advantage of inherent mass-selectivity, and offers a possibility of measuring simultaneously the lifetimes of different ion species with no need for prior mass-selection.

UR - http://www.scopus.com/inward/record.url?scp=84861580833&partnerID=8YFLogxK

U2 - 10.1063/1.3694997

DO - 10.1063/1.3694997

M3 - Review article

SN - 0034-6748

VL - 83

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 3

M1 - 033302

ER -

Lifetime measurements in an electrostatic ion beam trap using image charge monitoring

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this