NANOTRIBOLOGY OF DIAMOND FILMS STUDIED BY ATOMIC FORCE MICROSCOPY

G NEUBAUER; SR COHEN; GM MCCLELLAND; H SEKI

doi:10.1557/PROC-188-219

NANOTRIBOLOGY OF DIAMOND FILMS STUDIED BY ATOMIC FORCE MICROSCOPY

G NEUBAUER, SR COHEN, GM MCCLELLAND, H SEKI

Department of Chemical Research Support

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

An atomic force microscope, operated in ultra-high vacuum has been employed to study the tribological properties of diamond films under small loads (< 10−6 N) on a nanometer scale. The incidence of intermittent motion, “stick-slip”, while sliding a diamond tip across the diamond film, is detected under certain experimental conditions and is discussed with respect to the difference between static and kinetic friction, sample topography and a varying sample condition.

Original language	English
Title of host publication	THIN FILMS : STRESSES AND MECHANICAL PROPERTIES II
Editors	MF DOERNER, WC OLIVER, GM PHARR, FR BROTZEN
Pages	219-224
Number of pages	6
DOIs	https://doi.org/10.1557/PROC-188-219
Publication status	Published - 1990
Event	SYMP AT THE 1990 SPRING MEETING OF THE MATERIALS RESEARCH SOC - THIN FILMS : STRESSES AND MECHANICAL PROPERTIES 2 - San Francisco, United States Duration: 16 Apr 1990 → 19 Apr 1990

Publication series

Series	Materials Research Society Symposium Proceedings
Volume	188

Conference

Conference	SYMP AT THE 1990 SPRING MEETING OF THE MATERIALS RESEARCH SOC - THIN FILMS : STRESSES AND MECHANICAL PROPERTIES 2
Country/Territory	United States
City	San Francisco
Period	16/4/90 → 19/4/90

Access to Document

10.1557/PROC-188-219

Cite this

@inproceedings{8552af1fe3b743bd82405a507ba7fb51,

title = "NANOTRIBOLOGY OF DIAMOND FILMS STUDIED BY ATOMIC FORCE MICROSCOPY",

abstract = "An atomic force microscope, operated in ultra-high vacuum has been employed to study the tribological properties of diamond films under small loads (< 10−6 N) on a nanometer scale. The incidence of intermittent motion, “stick-slip”, while sliding a diamond tip across the diamond film, is detected under certain experimental conditions and is discussed with respect to the difference between static and kinetic friction, sample topography and a varying sample condition.",

author = "G NEUBAUER and SR COHEN and GM MCCLELLAND and H SEKI",

year = "1990",

doi = "10.1557/PROC-188-219",

language = "English",

isbn = "1-55899-077-1",

series = "Materials Research Society Symposium Proceedings",

publisher = "Materials Research Society",

pages = "219--224",

editor = "MF DOERNER and WC OLIVER and GM PHARR and FR BROTZEN",

booktitle = "THIN FILMS : STRESSES AND MECHANICAL PROPERTIES II",

note = "SYMP AT THE 1990 SPRING MEETING OF THE MATERIALS RESEARCH SOC - THIN FILMS : STRESSES AND MECHANICAL PROPERTIES 2 ; Conference date: 16-04-1990 Through 19-04-1990",

}

NEUBAUER, G, COHEN, SR, MCCLELLAND, GM & SEKI, H 1990, NANOTRIBOLOGY OF DIAMOND FILMS STUDIED BY ATOMIC FORCE MICROSCOPY. in MF DOERNER, WC OLIVER, GM PHARR & FR BROTZEN (eds), THIN FILMS : STRESSES AND MECHANICAL PROPERTIES II. Materials Research Society Symposium Proceedings, vol. 188, pp. 219-224, SYMP AT THE 1990 SPRING MEETING OF THE MATERIALS RESEARCH SOC - THIN FILMS : STRESSES AND MECHANICAL PROPERTIES 2, San Francisco, California, United States, 16/4/90. https://doi.org/10.1557/PROC-188-219

NANOTRIBOLOGY OF DIAMOND FILMS STUDIED BY ATOMIC FORCE MICROSCOPY. / NEUBAUER, G; COHEN, SR; MCCLELLAND, GM et al.
THIN FILMS : STRESSES AND MECHANICAL PROPERTIES II. ed. / MF DOERNER; WC OLIVER; GM PHARR; FR BROTZEN. 1990. p. 219-224 (Materials Research Society Symposium Proceedings, Vol. 188).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - NANOTRIBOLOGY OF DIAMOND FILMS STUDIED BY ATOMIC FORCE MICROSCOPY

AU - NEUBAUER, G

AU - COHEN, SR

AU - MCCLELLAND, GM

AU - SEKI, H

PY - 1990

Y1 - 1990

N2 - An atomic force microscope, operated in ultra-high vacuum has been employed to study the tribological properties of diamond films under small loads (< 10−6 N) on a nanometer scale. The incidence of intermittent motion, “stick-slip”, while sliding a diamond tip across the diamond film, is detected under certain experimental conditions and is discussed with respect to the difference between static and kinetic friction, sample topography and a varying sample condition.

AB - An atomic force microscope, operated in ultra-high vacuum has been employed to study the tribological properties of diamond films under small loads (< 10−6 N) on a nanometer scale. The incidence of intermittent motion, “stick-slip”, while sliding a diamond tip across the diamond film, is detected under certain experimental conditions and is discussed with respect to the difference between static and kinetic friction, sample topography and a varying sample condition.

U2 - 10.1557/PROC-188-219

DO - 10.1557/PROC-188-219

M3 - Conference contribution

SN - 1-55899-077-1

T3 - Materials Research Society Symposium Proceedings

SP - 219

EP - 224

BT - THIN FILMS : STRESSES AND MECHANICAL PROPERTIES II

A2 - DOERNER, MF

A2 - OLIVER, WC

A2 - PHARR, GM

A2 - BROTZEN, FR

T2 - SYMP AT THE 1990 SPRING MEETING OF THE MATERIALS RESEARCH SOC - THIN FILMS : STRESSES AND MECHANICAL PROPERTIES 2

Y2 - 16 April 1990 through 19 April 1990

ER -

NANOTRIBOLOGY OF DIAMOND FILMS STUDIED BY ATOMIC FORCE MICROSCOPY

Abstract

Publication series

Conference

Access to Document

Fingerprint

Cite this