Abstract
We present a novel, to the best of our knowledge, and straightforward approach for the spatio-spectral characterization of ultrashort pulses. This minimally intrusive method relies on placing a mask with specially arranged pinholes in the beam path before the focusing optic and retrieving the spectrally resolved laser wavefront from the speckle pattern produced at focus. We test the efficacy of this new method by accurately retrieving chromatic aberrations, such as pulse-front tilt (PFT), pulse-front curvature (PFC), and higher-order aberrations introduced by a spherical lens. The simplicity and scalability of this method, combined with its compatibility with single-shot operation, make it a strong complement to existing tools for high-intensity laser facilities.
| Original language | English |
|---|---|
| Pages (from-to) | 1900-1903 |
| Number of pages | 4 |
| Journal | Optics Letters |
| Volume | 49 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - 15 Apr 2024 |
Funding
We thank Prof. Dan Oron for the fruitful discussions. We also thank Dr. Nicolas Thurieau for printing the masks and Sébastien Brun and Pascal Rousseau for assistance in micro-drilling. Funding - WIS-CNRS (IPR LAMA); Dita and Yehuda Bronicki; R. Lapon; Schilling Foundation; Wolfson Foundation; Minerva; Israel Science Foundation; Benoziyo Endowment Fund for the Advancement of Science; Schwartz/Reisman Center for Intense Laser Physics; Laserlab-Europe (871124); Agence Nationale de la Recherche (ANR-10-LABX-0039-PALM, ANR-20-CE92-0043-01); Advanced Grant ExCoMet (694596); Horizon 2020 Framework Programme (101004730). Publisher Copyright: © 2024 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement.
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics